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Defect-Controlled Electronic Structure and Phase Stability in Thermoelectric Skutterudite CoSb_3

机译:热电Skutterudite CoSb_3中缺陷控制的电子结构和相稳定性

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摘要

Controlling extrinsic defects to tune the carrier concentration of electrons or holes is a crucial point concerning the engineering application of thermoelectric semiconductors. To understand the defect-controlled electronic structure in thermoelectric materials, we apply density functional theory (DFT) to investigate the defect chemistry of dopants M (M = O, S, Se, Te) in CoSb_3. DFT predicts that the breakage of Sb_4-rings induced by these dopants produces the unexpected (n- or p-type) conductivity behavior in CoSb_3. For example, energetically dominant O interstitials (Oi) chemically break Sb_4-rings and form O-4Sb five-membered rings, leading to the charge neutral behavior of O_i. While S interstitials (S_i) collapse Te-3Sb four-membered rings within Te doped CoSb_3 leading to a p-type conduction behavior, Se substitution on Sb (Se_(Sb)) breaks the Se-Te-2Sb four-membered ring resulting in a charge neutral behavior of the complex defect Se_(Sb)+Te_(Sb). Furthermore, the solubility limits of M dopants (M = S, Se, Te) are also calculated to provide essential information on single-phase material design. This study provides a new insight to understand the complicated chemical structure in doped CoSb_3, which is beneficial for devising effective doping strategies to develop high-performance bulk thermoelectric materials.
机译:控制外在缺陷以调节电子或空穴的载流子浓度是与热电半导体工程应用有关的关键点。为了了解热电材料中缺陷控制的电子结构,我们应用密度泛函理论(DFT)研究了CoSb_3中掺杂物M(M = O,S,Se,Te)的缺陷化学。 DFT预测,由这些掺杂剂引起的Sb_4-环的断裂会在CoSb_3中产生意外的(n型或p型)电导行为。例如,能量占优势的O间隙(Oi)化学破坏Sb_4-环并形成O-4Sb五元环,从而导致O_i处于电荷中性状态。当S间隙(S_i)使Te掺杂的CoSb_3内的Te-3Sb四元环塌陷而导致p型导电行为时,Sb上的Se取代(Se_(Sb))破坏了Se-Te-2Sb四元环,从而导致复杂缺陷Se_(Sb)+ Te_(Sb)的电荷中性行为。此外,还计算了M掺杂剂(M = S,Se,Te)的溶解度极限,以提供有关单相材料设计的基本信息。这项研究为了解掺杂CoSb_3中复杂的化学结构提供了新的见识,这有助于设计有效的掺杂策略以开发高性能的块状热电材料。

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